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dc.contributor.authorÖzden, Şadan
dc.contributor.authorBayhan, Habibe
dc.contributor.authorDonmez, A.
dc.contributor.authorBayhan, M.
dc.date.accessioned2020-11-20T16:36:20Z
dc.date.available2020-11-20T16:36:20Z
dc.date.issued2008
dc.identifier.issn1063-7826
dc.identifier.issn1090-6479
dc.identifier.urihttps://doi.org/10.1134/S1063782608070130
dc.identifier.urihttps://hdl.handle.net/20.500.12809/4949
dc.descriptionWOS: 000257584600013en_US
dc.description.abstractThe dark alternating current (ac) parameters of commercially available silicon p-i-n-photodiodes are measured and compared at room temperature both in forward and reverse bias using the impedance spectroscopy technique. The ac behavior of the photodiodes is found to be almost the same. For bias voltages in the range from -0.8 to 0.0 V, the typical photodiode behaves like a pure capacitor. For higher voltages (V >-0.2 V) the impedance spectra are nearly semicircular and typically distorted on the high frequency side. At 0.2 V the distortion apparently arises from one of the two interfaces. However, at high bias voltages the nature of the distortion is attributed to the variation of photodiode capacitance and resistance with measurement frequency.en_US
dc.item-language.isoengen_US
dc.publisherMaik Nauka/Interperiodica/Springeren_US
dc.item-rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectSilicon p-i-nen_US
dc.titleMeasurement and comparison of silicon p-i-n-photodiodes with ac impedance at different voltagesen_US
dc.item-typearticleen_US
dc.contributor.departmentMÜ, Fen Fakültesi, Fizik Bölümüen_US
dc.contributor.institutionauthorÖzden, Şadan
dc.contributor.institutionauthorBayhan, Habibe
dc.identifier.doi10.1134/S1063782608070130
dc.identifier.volume42en_US
dc.identifier.issue7en_US
dc.identifier.startpage834en_US
dc.identifier.endpage837en_US
dc.relation.journalSemiconductorsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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